Our MAX3SLH Fixed Slide Holder provides two spring clips to mount the optic and can be mounted to any of our 3-axis translation stages. These resolution test targets can be mounted in one of four of our microscopy slide holders. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 µm. See the Graphs tab for spectral data of the materials used in these test targets.

The positive reflective targets are composed of an antireflection-coated (AR-coated) chrome pattern etched on soda lime glass with an uncoated chrome background for high contrast in reflective applications. The negative targets use chrome to cover the substrates, leaving the patterns clear, and work well in back-lit and highly illuminated applications. The positive targets consist of low-reflectivity, vacuum-sputtered chrome patterns plated on clear substrates and are useful for front-lit and general applications. We also offer several versions of high-contrast positive reflective targets. For more information on each pattern, see the Resolution Targets tab.Īll of our resolution test targets are available as positive targets, and many have negative versions as well. Targets are also available with sector star (also known as Siemens star) patterns, Ronchi rulings, a variable line grating, or a combination of patterns for resolution and distortion testing. Thorlabs offers resolution test targets with 1951 USAF, NBS 1952, and NBS 1963A patterns. By identifying the largest set of non-distinguishable lines, one determines the resolving power of a given system. They consist of reference line patterns with well-defined thicknesses and spacings and are designed to be placed in the same plane as the object being imaged. Resolution test targets are typically used to measure the resolution of an imaging system. Combined Resolution and Distortion Target.High-Contrast Positive Reflective Versions Available.Positive NBS 1952 Resolution Test Targets.Positive and Negative 1951 USAF and NBS 1963A Resolution Test Targets.An R2L2S1N NBS 1963A Resolution Target Mounted in an XYF1 Test Target Positioner Features

Siemens star char